The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Mar. 08, 2022
Applicant:

Keyence Corporation, Osaka, JP;

Inventors:

Ryosuke Kondo, Osaka, JP;

Kenichiro Hirose, Osaka, JP;

Assignee:

KEYENCE CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/71 (2006.01); H04N 23/56 (2023.01); H04N 23/69 (2023.01);
U.S. Cl.
CPC ...
G01N 21/718 (2013.01); H04N 23/56 (2023.01); H04N 23/69 (2023.01); G01N 2201/06113 (2013.01);
Abstract

It is possible to save time and effort required for imaging of an analysis point and to improve usability of an analysis device. An analysis and observation device as a laser-induced breakdown spectroscope includes: a first camera, an electromagnetic wave emitter that emits laser light to a sample; a reflective object lens that collects plasma light generated in the sample; first and second detectors that generate intensity distribution spectra; and a processor. The processor controls the first camera in response to reception of a start trigger signal to generate a pre-irradiation image that is an image before the sample is irradiated with the laser light, and controls the electromagnetic wave emitter after controlling the first camera to emit the laser light to the sample.


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