The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2025
Filed:
Mar. 19, 2020
Hitachi, Ltd., Tokyo, JP;
Takuya Kambayashi, Tokyo, JP;
Toshimitsu Noguchi, Tokyo, JP;
Shunsuke Kono, Tokyo, JP;
Akihiro Nojima, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An arithmetic expression used for estimating a target item of a specimen is more easily incorporated into an optical measurement system. An optical measurement instrument includes an optical analysis unit configured to perform an optical analysis on a specimen and measure an intensity of light as a result of the optical analysis, and an arithmetic processing unit configured to download an arithmetic expression from a server device via a network, and perform a quantitative analysis on a target substance contained in the specimen by substituting the result of the optical analysis by the optical analysis unit into the arithmetic expression.