The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Feb. 15, 2022
Applicant:

The University of Tokyo, Tokyo, JP;

Inventors:

Daisuke Hirano, Tokyo, JP;

Makoto Gonokami, Tokyo, JP;

Kosuke Yoshioka, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/18 (2006.01); G01J 3/02 (2006.01); G01J 3/10 (2006.01); G01J 3/28 (2006.01); G01J 3/45 (2006.01);
U.S. Cl.
CPC ...
G01J 3/18 (2013.01); G01J 3/0229 (2013.01); G01J 3/10 (2013.01); G01J 3/2823 (2013.01); G01J 3/45 (2013.01);
Abstract

A coherent light source outputs coherent light including high-order harmonics obtained by irradiating short-pulse laser light to a nonlinear medium. A spectrometer includes a grating that diffracts the coherent light and an image sensor that measures an image of the diffracted light. In a first state, a first double slit having a pair of apertures spaced apart in a first direction is arranged at a predetermined position between coherent light source and an incident slit of spectrometer. In a second state, a second double slit that is a replica of first double slit is arranged at the predetermined position as a replacement of first double slit with a sample held in one aperture. A calculation processing device calculates optical constants of the sample based on interference images measured in the first and second states.


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