The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Dec. 21, 2023
Applicant:

Ram Photonics Industrial, Llc, Webster, NY (US);

Inventors:

Per Adamson, Conesus, NY (US);

Mike Cinquino, Conesus, NY (US);

Joseph Lawson, Rochester, NY (US);

Jordan Leidner, Brighton, NY (US);

Assignee:

RAM Photonics Industrial, LLC, Webster, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/02 (2006.01); G01J 1/42 (2006.01);
U.S. Cl.
CPC ...
G01J 1/0252 (2013.01); G01J 1/4257 (2013.01);
Abstract

A method for profiling a laser beam includes receiving the laser beam at a thermochromic interface of a detector. A temperature set point for the detector can be selected. The temperature set point can correspond to an equilibrium temperature at the thermochromic interface. The method can also include capturing an image of the thermochromic interface and using the image to determine a partial intensity profile corresponding to at least a portion of the beam intensity profile. A reconstructed beam profile can be assembled using the partial intensity profile. If the reconstructed beam profile is not complete, the method can include iterating over additional temperature set points to determine additional partial intensity profiles. The method can also include determining that the reconstructed beam profile is complete and outputting the reconstructed beam profile.


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