The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Feb. 03, 2022
Applicant:

Cnh Industrial America Llc, New Holland, PA (US);

Inventor:

Brett McClelland, Chicago, IL (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01G 23/01 (2006.01); A01D 41/127 (2006.01); A01D 90/10 (2006.01); G01G 17/00 (2006.01); G01G 19/08 (2006.01);
U.S. Cl.
CPC ...
G01G 23/01 (2013.01); A01D 41/127 (2013.01); A01D 90/10 (2013.01); G01G 17/00 (2013.01); G01G 19/08 (2013.01);
Abstract

A method for facilitating calibration of a yield monitor, including receiving, via a controller of a yield monitor calibration system, a first signal indicative of a first weight value from a scale of the yield monitor calibration system, wherein the scale is configured to monitor weight of harvested crops in a mobile storage compartment configured to receive the harvested crops from a harvester during an unloading operation. The method also includes receiving, via the controller, a second signal indicative of a second weight value from the scale in response to receiving a third signal indicative of the harvester completing the unloading operation, comparing, via the controller, the first weight value to the second weight value to determine a difference value, as well as outputting, via the controller, the difference value to the yield monitor to enable the yield monitor to perform a calibration process.


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