The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2025
Filed:
Nov. 05, 2020
Universita' Degli Studi Di Milano, Milan, IT;
Centre National DE LA Recherche Scientifique, Paris, FR;
Ecole Polytechnique, Palaiseau, FR;
Simone Cialdi, Monza e Brianza, IT;
Daniele Ernesto Cipriani, Milan, IT;
Stefano Capra, Varese, IT;
François Mathieu, Draveil, FR;
Zeudi Mazzotta, Breukelen, NL;
ECOLE POLYTECHNIQUE, Palaiseau, FR;
Abstract
A device for measuring an angular inclination and angular inclination fluctuations of an electromagnetic radiation beam is adapted to detect the incidence angular inclination and the relative fluctuations with respect to a nominal axis of propagation of the beam, in a desired detection plane including the nominal propagation axis. A system and a method for measuring an angular inclination and angular inclination fluctuations of an electromagnetic radiation beam uses the device for measuring an angular inclination and angular inclination fluctuations of an electromagnetic radiation beam. A method measures a spatial shift of a focused laser beam, at the focusing point, with respect to a reference optical axis.