The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Oct. 28, 2022
Applicant:

Align Technology, Inc., San Jose, CA (US);

Inventors:

Viswanath Meenakshisundaram, Santa Clara, CA (US);

Srinivas Kaza, Mountain View, CA (US);

Chunhua Li, Cupertino, CA (US);

Lance Robert Pickens, Campbell, CA (US);

Shawn Stromenger, Milpitas, CA (US);

Jun Sato, San Jose, CA (US);

Siobhan O'Leary, Santa Clara, CA (US);

Peter Webber, San Francisco, CA (US);

Brett E. Kelly, Oakland, CA (US);

Jennifer Chavez, Fremont, CA (US);

Assignee:

Align Technology, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/35 (2017.01); A61C 7/08 (2006.01); B08B 7/00 (2006.01); B08B 7/04 (2006.01); B29C 35/08 (2006.01); B29C 64/124 (2017.01); B29C 64/30 (2017.01); B29C 64/357 (2017.01); B29C 64/379 (2017.01); B29C 64/386 (2017.01); B29C 71/04 (2006.01); B29L 31/00 (2006.01); B33Y 40/20 (2020.01); B33Y 50/00 (2015.01); B33Y 80/00 (2015.01);
U.S. Cl.
CPC ...
B29C 64/35 (2017.08); B08B 7/0071 (2013.01); B08B 7/04 (2013.01); B29C 35/0805 (2013.01); B29C 64/30 (2017.08); B29C 64/357 (2017.08); B29C 64/379 (2017.08); B29C 64/386 (2017.08); B29C 71/04 (2013.01); B33Y 40/20 (2020.01); B33Y 50/00 (2014.12); B33Y 80/00 (2014.12); A61C 7/08 (2013.01); B29C 64/124 (2017.08); B29L 2031/753 (2013.01);
Abstract

Systems, methods, and devices for post-processing additively manufactured objects are disclosed herein. In some embodiments, a method includes receiving a plurality of additively manufactured objects having excess material thereon. The method can include removing the excess material from the plurality of additively manufactured objects by rotating the plurality of additively manufactured objects. The method can also include receiving sensor data indicative of a cleaning status of the plurality of additively manufactured objects. The method can further include adjusting, based on the sensor data, an operational parameter that enhances removal of the excess material from the plurality of additively manufactured objects.


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