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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12240039 B1

PDFFull Text
Date of Patent:
Mar. 04, 2025

Filed:

Apr. 29, 2021

Systems and methods for measuring radiation emitted during a three-dimensional printing process

Applicant:

Nikon Corporation, Tokyo, JP;

Inventor:

Eric Peter Goodwin, Oro Valley, AZ (US);

Assignee:

NIKON CORPORATION, Tokyo, JP;

Attorneys:

STEVEN CAHILL

ANNA ISON

DANIEL JOSEPH KENNEDY

Primary Examiner:

Michael J Brown

Int. Cl.
CPC ...
B22F 10/368 (2021.01); B22F 10/28 (2021.01); B22F 10/80 (2021.01); B22F 12/30 (2021.01); B22F 12/41 (2021.01); B22F 12/90 (2021.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/00 (2015.01); B22F 10/85 (2021.01);
U.S. Cl.
CPC ...
B22F 10/368 (2021.01); B22F 10/28 (2021.01); B22F 10/80 (2021.01); B22F 12/30 (2021.01); B22F 12/41 (2021.01); B22F 12/90 (2021.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/00 (2014.12);
Abstract

The problem of measuring the temperature of a 3D printing process is addressed by systems and methods that apply imaging spectrometry to measure blackbody radiation emitted before, during, or after a 3D printing process. The systems and methods utilize a pair of lenses, a field stop, and a wavelength separator to direct a plurality of wavelengths corresponding to the blackbody radiation to pixels of an optical detector. The plurality of wavelengths are analyzed by a controller to determine the temperature of the 3D printed component.

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Goodwin, Eric. (2025). Systems and methods for measuring radiation emitted during a three-dimensional printing process (U.S. Patent No. 12240039). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12240039

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