The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Nov. 25, 2020
Applicants:

Yuki Miyano, Tokyo, JP;

Taishi Watanabe, Tokyo, JP;

Shigenori Kawabata, Tokyo, JP;

Inventors:

Yuki Miyano, Tokyo, JP;

Taishi Watanabe, Tokyo, JP;

Shigenori Kawabata, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/46 (2024.01); A61B 5/242 (2021.01); A61B 5/248 (2021.01);
U.S. Cl.
CPC ...
A61B 6/463 (2013.01); A61B 5/242 (2021.01); A61B 5/248 (2021.01);
Abstract

A biometric information display apparatus () for displaying a measurement result obtained by measuring a biometric signal, includes a maximum value calculation unit () configured to calculate a maximum value of the measurement result in a certain period of time for at least one of blocks into which a measurement area, in which the biometric signal is measured, is divided, a determination unit () configured to determine whether a measurement value in the at least one of blocks is greater than or equal to a threshold value obtained by multiplying the maximum value by a fractional value, the fractional value being determined in advance, and a display control unit configured to display, in response to an occurrence of an event in which the measurement value is determined to be greater than or equal to the threshold value, the measurement result in such a manner as to indicate the occurrence of the event.


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