The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Oct. 15, 2021
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Hirofumi Yoshida, Kanagawa, JP;

Yuki Shimozato, Tokyo, JP;

Hayato Shioda, Kanagawa, JP;

Shinya Tanaka, Tokyo, JP;

Kazuhide Miyata, Kanagawa, JP;

Ritsuya Tomita, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/15 (2006.01); A61B 3/00 (2006.01); A61B 3/10 (2006.01); A61B 3/12 (2006.01);
U.S. Cl.
CPC ...
A61B 3/152 (2013.01); A61B 3/0041 (2013.01); A61B 3/102 (2013.01); A61B 3/12 (2013.01);
Abstract

An ophthalmic apparatus includes an inspection unit configured to inspect an eye to be inspected, a driving unit configured to drive the inspection unit, and a control unit configured to start control of the inspection unit and the driving unit based on an inspection protocol in response to a predetermined condition, the inspection protocol defining a series of control procedures for performing a plurality of inspections including an alignment adjustment for aligning the inspection unit with the eye to be inspected, wherein the control unit is configured to display results of the plurality of inspections and display information for accepting an instruction to retry a part of the plurality of inspections on a display unit.


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