The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2025
Filed:
May. 26, 2021
Eyenuk, Inc., Woodland Hills, CA (US);
Ji Sun Moon, Tarzana, CA (US);
Malavika Bhaskaranand, Woodland Hills, CA (US);
Chaithanya Amai Ramachandra, West Hills, CA (US);
Gregory John Alexander Russell, Woodland Hills, CA (US);
Kaushal Mohanlal Solanki, West Hills, CA (US);
EYENUK, INC., Woodland Hills, CA;
Abstract
Various embodiments for eye imaging, screening, diagnosis, and monitoring are provided. Some embodiments comprise systems for retinal imaging capable of capturing multiple high resolution images using multiple quick succession flashes. The images can be combined to provide for a complete image of the retina of a target FOV without corneal reflections. In some embodiments, a system for retinal imaging can utilize an optical design pupil layout that allocates a large area for the path of imaging rays on the eye pupil by using a narrow buffer area. In other embodiments, a system for retinal imaging can comprise a main device, including an imaging and sensing device, and a robotic system, including an eye tracker and/or sensors, wherein the robotic system is capable of automatically aligning the main device and selecting an optimal imaging mode by detecting a pupil size of an eye and is combined with an AI analysis tool.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile