The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Jun. 05, 2024
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Kulwinder Saini, Bavaria-Bayern, DE;

Vijayant Kumar, Munich, DE;

Assignee:

APPLE INC., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 36/00 (2009.01);
U.S. Cl.
CPC ...
H04W 36/0069 (2018.08); H04W 36/0022 (2013.01); H04W 36/00222 (2023.05); H04W 36/0058 (2018.08); H04W 36/00837 (2018.08); H04W 36/0085 (2018.08); H04W 36/00698 (2023.05);
Abstract

Systems and methods for ultra reliable reporting of secondary cell group (SCG) measurements to a secondary node (SN) used in multi-radio dual connectivity (MR-DC) operation that specifically account for the possibility of SCG special cell (SpCell) degradation are disclosed herein. A user equipment (UE) may establish a signaling radio bearer (SRB) 3 with the SN. The UE may then identify that a handover condition (which may be associated with SCG SpCell degradation) for the SCG SpCell is met, and accordingly send an SCG measurement report over each of the SRB3 and an SRB1 between the UE and a master node (MN) used in the MR-DC operation. Such information received at the MN is forwarded to the SN. Accordingly, the reception of SCG measurement reports (to enable handover to a new SpCell by the SN) is not solely dependent messages on the SpCell of the SCG alone (using SRB3), improving reliability.


Find Patent Forward Citations

Saini, Kulwinder. (2025). Ultra reliable reporting of scg measurements while spcell degrades (U.S. Patent No. 12238595). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12238595

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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