The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Jan. 26, 2024
Applicant:

Netskope, Inc., Santa Clara, CA (US);

Inventors:

James S. Robinson, Indianapolis, IN (US);

Vadon Willis, Nashville, TN (US);

John Khotsyphom, St. Louis, MO (US);

Assignee:

Netskope, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 67/1396 (2022.01);
U.S. Cl.
CPC ...
H04L 67/1396 (2022.05);
Abstract

The present disclosure provides an electronic inspection method and system comprising user endpoints, end-link servers belonging to a tenant, and a mid-link server. The mid-link server connects the user endpoints with an end-link server through tunnels. The mid-link server models an interaction in the tunnels using a model of an application layer. The mid-link server receives communication from the user endpoints through the tunnels, differentiates between a data object, and stores the data object based on a plurality of policies and context developed. The mid-link analyzes the model and the data object in the tunnels and determines the context according to a policy. The mid-link server performs the electronic inspection between a plurality of end-link servers and a plurality of user endpoints by inspecting the data object from the plurality of tunnels.


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