The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Sep. 01, 2020
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Hiromichi Endoh, Tokyo, JP;

Tatsuya Maruyama, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 47/24 (2022.01); H04L 9/40 (2022.01); H04L 47/20 (2022.01);
U.S. Cl.
CPC ...
H04L 47/24 (2013.01); H04L 47/20 (2013.01); H04L 63/1433 (2013.01);
Abstract

A communication test device may comprise a reception portion that receives a non-priority frame that may be divided into a plurality of fragments and a priority frame that is not divided as communication frames, a test portion that tests the communication frames in accordance with a predefined test rule and determines whether the communication frame is an invalid frame, a hold portion that holds status information indicating a status of the test by the test portion, a transmission portion that transmits the communication frame tested in the test portion, and/or an interception control portion that controls interception of the communication frame based on a determination result of the test portion.


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