The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Nov. 10, 2023
Applicant:

Ionq, Inc., College Park, MD (US);

Inventors:

Jonathan Albert Mizrahi, Silver Spring, MD (US);

Neal Pisenti, Portland, OR (US);

Assignee:

IonQ, Inc., College Park, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 3/13 (2006.01); G06N 10/00 (2022.01); H01S 3/097 (2006.01);
U.S. Cl.
CPC ...
H01S 3/1305 (2013.01); H01S 3/1306 (2013.01); H01S 3/1307 (2013.01); H01S 3/1308 (2013.01); H01S 3/09707 (2013.01);
Abstract

Aspects of the present disclosure describe techniques for fast stabilization of multiple controller beams with continuous integrating filter. For example, a method is described for intensity stabilization of laser beams (e.g., ion controller beams) in a trapped ion system, where the method includes applying a linear array of laser beams to respective ions in a linear array of ions in a trap, performing, in response to the laser beams being applied, parallel measurements on the ions, the parallel measurements including multiple, separate measurements on each of the ions to identify fluctuations in intensity in the respective laser beams at each ion, and adjusting the intensity of one or more of the laser beams in response to fluctuations being identified from the parallel measurements. A corresponding system for intensity stabilization of laser beams in a trapped ion system is also described.


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