The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Dec. 30, 2021
Applicant:

Wuhan Xinxin Semiconductor Manufacturing Co., Ltd., Hubei, CN;

Inventors:

Danqing Wei, Hubei, CN;

Fei Chen, Hubei, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14634 (2013.01); H01L 24/08 (2013.01); H01L 2224/08145 (2013.01);
Abstract

A semiconductor device and a semiconductor die are disclosed. The semiconductor device includes: a SPAD wafer containing SPAD dies formed thereon with respective SPAD arrays; a TDC wafer containing TDC dies formed thereon with respective TDC arrays; and a logic wafer containing logic dies formed thereon with respective peripheral logic circuits. The SPAD wafer, TDC wafer and logic wafer are bonded in the sequence set forth. The TDC arrays and peripheral logic circuits are arranged on the TDC and logic wafers, respectively, and the SPAD arrays are bonded to the TDC arrays. The three wafers are bonded and integrated together to form the semiconductor device using a multi-wafer stacking technique. The increased integration of the semiconductor device means an increased fill factor of SPAD arrays for same size, resulting in improved photon detection efficiency of the semiconductor device and improved detection performance of single-photon detectors fabricated from the semiconductor device.


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