The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2025
Filed:
Jul. 15, 2021
Applicant:
Vuereal Inc., Waterloo, CA;
Inventors:
Gholamreza Chaji, Waterloo, CA;
Ehsanollah Fathi, Waterloo, CA;
Hossein Zamani Siboni, Waterloo, CA;
David Hwang, Waterloo, CA;
Assignee:
VueReal Inc., Waterloo, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); G01R 1/04 (2006.01); H01L 23/28 (2006.01); H01L 23/48 (2006.01); H01L 29/15 (2006.01);
U.S. Cl.
CPC ...
H01L 22/32 (2013.01); G01R 1/0416 (2013.01); H01L 23/28 (2013.01); H01L 23/481 (2013.01); H01L 29/157 (2013.01);
Abstract
The present invention relates to the inspection process which includes providing access to the microdevice contacts, measuring the microdevice and analyzing the data to identify defects or performance of the micro device. The invention also relates to the forming of test electrodes on microdevices. The test electrodes may be connected to hidden contacts. The type of microdevices may be vertical, lateral or a flip chip.