The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Aug. 26, 2022
Applicant:

Kioxia Corporation, Tokyo, JP;

Inventor:

Takashi Nakagawa, Chofu Tokyo, JP;

Assignee:

Kioxia Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 16/26 (2006.01); G06F 3/06 (2006.01); G11C 16/04 (2006.01); G11C 16/10 (2006.01); G11C 16/34 (2006.01); G11C 29/02 (2006.01); G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
G11C 16/26 (2013.01); G06F 3/0658 (2013.01); G11C 16/0483 (2013.01); G11C 16/10 (2013.01); G11C 16/3404 (2013.01); G11C 29/021 (2013.01); G11C 29/028 (2013.01); G11C 29/50004 (2013.01);
Abstract

A memory system includes first and second memory cells, and a controller configured to write data having a first value in the first memory cells and data having a second value in the second memory cells, determine a first voltage by executing a tracking process, and read data from the memory cells using the first voltage. In the tracking process, the controller performs a plurality of read operations to determine a first distribution of the memory cells, estimate a second distribution of the first memory cells based on the first distribution, calculate a third distribution of the second memory cells based on a difference between the first distribution and the second distribution, and determine a voltage that is within the third voltage as the first voltage based on the second distribution and the third distribution.


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