The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Dec. 14, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Hee Min Choi, Seoul, KR;

Hyoa Kang, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/762 (2022.01); G06N 3/045 (2023.01); G06V 20/58 (2022.01);
U.S. Cl.
CPC ...
G06V 10/762 (2022.01); G06N 3/045 (2023.01); G06V 20/58 (2022.01);
Abstract

A processor-implemented method with neural network training includes: determining first backbone feature data corresponding to each input data by applying, to a first neural network model, two or more sets of the input data of the same scene, respectively; determining second backbone feature data corresponding to each input data by applying, to a second neural network model, the two or more sets of the input data, respectively; determining projection-based first embedded data and dropout-based first view data from the first backbone feature data; and determining projection-based second embedded data and dropout-based second view data from the second backbone feature data; and training either one or both of the first neural network model and the second neural network model based on a loss determined based on a combination of any two or more of the first embedded data, the first view data, the second embedded data, the second view data, and an embedded data clustering result.


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