The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2025
Filed:
Dec. 16, 2020
Align Technology, Inc., San Jose, CA (US);
Assaf Weiss, Yavne, IL;
Maxim Volgin, Moscow, RU;
Pavel Agniashvili, Moscow, RU;
Chad Clayton Brown, Cary, NC (US);
Alexander Raskhodchikov, Moscow, RU;
Avi Kopelman, Palo Alto, CA (US);
Michael Sabina, Campbell, CA (US);
Moti Ben-Dov, Tel Mond, IL;
Shai Farkash, Hod Hasharon, IL;
Igor Makiewsky, Ramat Gan, IL;
Maayan Moshe, Ramat Hasharon, IL;
Ofer Saphier, Rechovot, IL;
Align Technology, Inc., San Jose, CA (US);
Abstract
In embodiments, a processing device detects a margin line in a model of a preparation from one or more images. The processing device determines, for each segment of a plurality of segments of the margin line, a quality score for the segment. The processing device determines that a segment of the margin line has a quality score that is below a quality threshold, wherein the segment of the margin line was generated based on a first set of images. Responsive to determining that the segment of the margin line has the quality score that is below the quality threshold, the processing devices updates the three-dimensional model of the preparation by replacing a portion of the three-dimensional model associated with the segment of the margin line with image data from at least one of a new image or a second set of images.