The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Oct. 28, 2022
Applicant:

GE Precision Healthcare Llc, Wauwatosa, WI (US);

Inventors:

Gireesha Chinthamani Rao, Pewaukee, WI (US);

Ravi Soni, San Ramon, CA (US);

Gopal B. Avinash, Concord, CA (US);

Poonam Dalal, Brookfield, WI (US);

Beth A. Heckel, Waukesha, WI (US);

Assignee:

GE Precision Healthcare LLC, Wauwatosa, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/70 (2017.01); G06T 3/60 (2024.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 3/60 (2013.01); G06T 7/70 (2017.01); G06T 2207/10116 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/30004 (2013.01); G06T 2207/30168 (2013.01);
Abstract

An artificial intelligence (AI) X-ray image information detection and correction system is employed either as a component of the X-ray imaging system or separately from the X-ray imaging system to automatically scan post-exposure X-ray images to detect various types of information or characteristics of the X-ray image, including, but not limited to, anatomy, view, orientation and laterality of the X-ray image, along with an anatomical landmark segmentation. The information detected about the X-ray image can then be stored by the AI system in association with the X-ray image for use in various downstream X-ray system workflow automations and/or reviews of the X-ray image.


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