The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2025
Filed:
Jan. 18, 2021
Fanuc Corporation, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
Various factors may cause an error between the shape of a workpiece machined by an industrial machine and the target shape of the workpiece. An image analysis device includes a first image generating section that generates first image data indicating a first distribution of locations on a workpiece of an error between a shape of the workpiece machined by an industrial machine and a pre-prepared target shape of the workpiece; a second image generating section that generates second image data indicating a second distribution of locations on the workpiece of an error between a command transmitted to the industrial machine for machining the workpiece and feedback from the industrial machine corresponding to the command; and a correlation acquisition section that obtains a correlation between the first distribution and the second distribution, based on the first image data and the second image data.