The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Mar. 02, 2022
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Yun Xiang, Tokyo, JP;

Satoshi Ito, Kawaski Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 3/14 (2006.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06F 3/14 (2013.01); G06T 7/73 (2017.01); G06T 2207/10016 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/20081 (2013.01);
Abstract

According to one embodiment, an anomaly detection device includes a processor that is configured to acquire input data. The processor derives a first anomaly degree corresponding to a difference between first feature data derived from the input data using a trained deep model and second feature data derived from the input data using a trained prediction model. The processor derives a second anomaly degree corresponding to an estimated relative positional relationship between a first and second region in the image data based on the second feature data. A total anomaly degree for the input data is then calculated from the first anomaly degree and the second anomaly degree.


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