The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2025
Filed:
Sep. 14, 2021
Idis Co., Ltd., Daejeon-si, KR;
Jun Hyeok Heo, Seongnam-si, KR;
Jin Seong Kim, Seongnam-si, KR;
Chul Kim, Seongnam-si, KR;
Eun Chul Cha, Anyang-si, KR;
IDIS CO., LTD., Daejeon-si, KR;
Abstract
Disclosed is an image analysis apparatus for analyzing a camera image. The image analysis apparatus for analyzing a camera image segments an input fisheye camera image into segmented images with a preset size field of view and superimposes the segmented images so that some regions overlap, performs dewarping on each of the segmented images, then combines the segmented images on which the dewarping is performed using a preset combination method, generates an analysis image, and detects objects included in the analysis image. In this case, the image analysis apparatus removes a result recognized as a duplicate from a detection result of the object by post-processing.