The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2025
Filed:
Jul. 21, 2020
Applicant:
Kpmg Llp, New York, NY (US);
Inventors:
Pradeep Pai, Fort Lee, NJ (US);
Bimal Sahay, Secaucus, NJ (US);
Anu Sandhu, Chatham, NJ (US);
Jorge Blanco, Clinton, NJ (US);
Assignee:
KPMG LLP, New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/23 (2019.01); G06F 16/215 (2019.01); G06F 16/28 (2019.01); G06F 40/169 (2020.01); G06F 40/295 (2020.01); G06F 40/30 (2020.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01); G06Q 10/0635 (2023.01); G06Q 50/18 (2012.01); G06Q 30/018 (2023.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01); G06F 16/215 (2019.01); G06F 16/285 (2019.01); G06F 40/169 (2020.01); G06F 40/295 (2020.01); G06F 40/30 (2020.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01); G06Q 10/0635 (2013.01); G06Q 50/18 (2013.01); G06Q 30/018 (2013.01);
Abstract
Systems and methods for performing machine-driven analysis and determination of integrity due diligence risk associated with third-party entities and individuals associated with third-party entities are disclosed.