The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Dec. 17, 2020
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Wei Cao, Shanghai, CN;

Hao Wang, Shanghai, CN;

Nicholas Chun Wei, Shanghai, CN;

Kshitij Patel, Cary, NC (US);

Xueyun Li, Shanghai, CN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/21 (2019.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 16/211 (2019.01); G06F 3/0604 (2013.01); G06F 3/0629 (2013.01); G06F 3/0653 (2013.01); G06F 3/067 (2013.01);
Abstract

Methods, apparatus, and processor-readable storage media for efficient storage of key-value data with schema integration are provided herein. An example computer-implemented method includes obtaining a metrics data message associated with a product, wherein the metrics data message has a first format and comprises a schema version and a type of the product; identifying one of a plurality of schema definitions for the metrics data message based at least in part on the schema version and the type of the product; converting the metrics data message into a second format based on the identified schema definition, wherein the second format removes at least some redundant data from the metrics data message; and storing the converted metrics data message in a metrics database.


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