The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Dec. 06, 2021
Applicant:

Evident Corporation, Tatsuno-machi, JP;

Inventor:

Shinichi Hayashi, Tokyo, JP;

Assignee:

Evident Corporation, Nagano, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/06 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 21/0064 (2013.01); G02B 21/06 (2013.01); G02B 21/365 (2013.01);
Abstract

An observation apparatus includes a first intensity modulation section arranged on an optical path of illumination light with which an observation object is to be irradiated, the first intensity modulation section modulating an intensity distribution of the illumination light, and a second intensity modulation section arranged on an optical path of observation light from the observation object irradiated with the illumination light, the second intensity modulation section modulating an intensity distribution of the observation light.


Find Patent Forward Citations

Hayashi, Shinichi. (2025). Observation apparatus (U.S. Patent No. 12235427). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12235427

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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