The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Sep. 16, 2019
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Sjoerd Stallinga, Delfgauw, NL;

Leon Van Der Graaff, Delft, NL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 21/0048 (2013.01); G02B 21/006 (2013.01); G02B 21/0076 (2013.01);
Abstract

The present disclosure relates to a microscopic imaging system for three-dimensional imaging An optical system is provided for focusing illumination light generated by a light source to form a plurality of foci within an object. The optical system is further configured so that the foci, when seen relative to an optical axis of the optical system along which the illumination light is incident on the object, are mutually displaced from each other in an axial direction and mutually displaced from each other in a lateral direction. The optical system and/or a detector system are configured to compensate for the displacement along the axial direction so that for each of the foci, a light receiving portion of the detector system which receives a portion of the detection light is substantially located at a position which is optically conjugate to at least a portion of the respective focus.


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