The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Mar. 29, 2023
Applicant:

Government of the United States of America, As Represented BY the Secretary of Commerce, Gaithersburg, MD (US);

Inventors:

Yicheng Wang, Germantown, MD (US);

Bryan Christopher Waltrip, Frederick, MD (US);

Stephan Schlamminger, Silver Spring, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01); G01R 27/30 (2006.01);
U.S. Cl.
CPC ...
G01R 27/30 (2013.01); G01R 35/005 (2013.01);
Abstract

A double-balance electronic test apparatus can measure inductance, capacitance, and resistance more accurately than a single-balance meter. The double-balance electronic test apparatus includes two circuits to balance the impedance of a device under test, and uses the balance to calculate the inductance, capacitance, and resistance of the impedance device under test.


Find Patent Forward Citations

Wang, Yicheng. (2025). Double-balance electronic test apparatus and measuring inductance, capacitance, and resistance (U.S. Patent No. 12235303). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12235303

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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