The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2025
Filed:
Jan. 25, 2022
Yokogawa Electric Corporation, Tokyo, JP;
Yokogawa Test & Measurement Corporation, Tokyo, JP;
Etsuro Nakayama, Hachiouji, JP;
YOKOGAWA ELECTRIC CORPORATION, Tokyo, JP;
Yokogawa Test & Measurement Corporation, Tokyo, JP;
Abstract
A measurement device () includes a first processor () that performs first pipeline processing on a first input signal according to a first sample timing, a second processor () that performs second pipeline processing on a second input signal according to a second sample timing with a sampling period longer than the first sample timing, an adjustment unit that adjusts an output timing of the first input signal on which the first pipeline processing was performed to match an output timing of the second input signal on which the second pipeline processing was performed, and a creation unit () that sequentially creates a waveform of the first input signal on which the first pipeline processing was performed and for which the output timing was adjusted by the adjustment unit, and a waveform of the second input signal on which the second pipeline processing was performed.