The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2025
Filed:
Jun. 08, 2017
Applicant:
Denka Company Limited, Tokyo, JP;
Inventors:
Assignee:
Denka Company Limited, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); G01N 1/40 (2006.01); G01N 33/569 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54388 (2021.08); G01N 1/40 (2013.01); G01N 33/569 (2013.01); G01N 2400/00 (2013.01);
Abstract
The present invention relates to an immunochromatography test method of measuring a sugar chain antigen, which provides an immunochromatographic test piece and a specimen adding device capable of specifically measuring a sugar chain antigen, and an immunochromatography method using the same; wherein after mixing a specimen with a nitrite solution, a step of allowing tartaric acid to come into contact with the mixture, and extracting a sugar chain antigen contained in the specimen is carried out in a filtration step.