The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Jun. 19, 2024
Applicants:

Arvind Agarwal, Miami, FL (US);

Abhijith Kunneparambil Sukumaran, Miami, FL (US);

Brandon A. Aguiar, Miami, FL (US);

Cheng Zhang, Miami, FL (US);

Inventors:

Arvind Agarwal, Miami, FL (US);

Abhijith Kunneparambil Sukumaran, Miami, FL (US);

Brandon A. Aguiar, Miami, FL (US);

Cheng Zhang, Miami, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/56 (2006.01); G01N 3/06 (2006.01);
U.S. Cl.
CPC ...
G01N 3/567 (2013.01); G01N 3/068 (2013.01); G01N 2203/0226 (2013.01); G01N 2203/0228 (2013.01);
Abstract

Erosion test rigs are provided for propelling dust and/or particles at high velocity and providing variable temperature ranges, as well as methods of using and fabricating the same. The erosion test rig can propel dust and/or particles at a velocity of up to 400 meters per second (m/s) and generate wide temperature ranges (e.g., from −196° C. to 200° C.) to simulate the harsh erosive conditions of planetary environments (e.g., Mars and Luna).


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