The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2025
Filed:
May. 25, 2022
Applicant:
Rapiscan Systems, Inc., Torrance, CA (US);
Inventor:
Edward James Morton, Guildford, GB;
Assignee:
Rapiscan Systems, Inc., Torrance, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01); G01N 23/04 (2018.01); G01N 23/20 (2018.01); G01N 23/20008 (2018.01); G01V 5/20 (2024.01); G01V 5/22 (2024.01); G01V 5/222 (2024.01); G21K 1/04 (2006.01); H05G 1/70 (2006.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); G01N 23/20008 (2013.01); G01N 23/20083 (2013.01); G01V 5/20 (2024.01); G01V 5/222 (2024.01); G01V 5/223 (2024.01); G01V 5/232 (2024.01); G21K 1/043 (2013.01); G01N 2201/10 (2013.01); G01N 2201/1047 (2013.01); H05G 1/70 (2013.01);
Abstract
The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.