The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2025
Filed:
Mar. 17, 2023
Tata Consultancy Services Limited, Mumbai, IN;
Arijit Chowdhury, Kolkata, IN;
Anwesha Khasnobish, Kolkata, IN;
Smriti Rani, Kolkata, IN;
Achanna Anil Kumar, Bangalore, IN;
Soumya Chakravarty, Kolkata, IN;
Arpan Pal, Kolkata, IN;
Tapas Chakravarty, Kolkata, IN;
TATA CONSULTANCY SERVICES LIMITED, Mumbai, IN;
Abstract
This disclosure relates generally to material quality inspection. Conventional approaches available for material quality inspection are unable to address concerns of complexity and cost involved. The technical problem of occluded object detection and material quality inspection for intrinsic defects identification is addressed in the present disclosure. The present disclosure provides a system and method for non-intrusive material quality inspection using three-dimensional monostatic radar based imaging, where the object under inspection undergoes a circular translation motion on a rotating platform. A modified delay-and-sum (m-DAS) algorithm is built by incorporating virtual antenna array to obtain a 3D image reconstruction of the object. From 3D reconstructed images, radial displacement as well as the angular locations of the object is identified which are further used for quality inspection of the material comprised in the object.