The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2025
Filed:
Apr. 10, 2023
Samsung Display Co., Ltd., Yongin-si, KR;
SAMSUNG DISPLAY CO., LTD., Yongin-si, KR;
Abstract
A method of determining whether a display manufacturing facility is abnormal includes a first step of obtaining facility information data of facilities used to manufacture a display panel, a second step of preparing a display module by attaching a printed circuit board and a driving chip to the display panel, a third step of obtaining preliminary inspection data through an on-off test on the display module, a fourth step of associating the facility information data with the preliminary inspection data, establishing a database by repeatedly performing the first step to the fourth step, obtaining real-time inspection data through an on-off test on a display module to be inspected, determining whether the display module to be inspected is normal, and determining a facility causing abnormality of the display module, from the real-time inspection data by using the database, in case that the display module to be inspected is abnormal is determined.