The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Oct. 17, 2019
Applicants:

Seoul National University R&db Foundation, Seoul, KR;

Institute for Basic Science, Daejeon, KR;

Inventors:

Je Geun Park, Seoul, KR;

Ha Leem Kim, Seoul, KR;

Matthew John Coak, Coventry, GB;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01K 1/14 (2021.01); G01K 1/02 (2021.01); G01K 7/34 (2006.01); G01K 13/00 (2021.01);
U.S. Cl.
CPC ...
G01K 1/14 (2013.01); G01K 1/026 (2013.01); G01K 7/34 (2013.01); G01K 13/006 (2013.01);
Abstract

Provided is a probe system for low-temperature high-precision heat transport measurement, the probe system including a sample loader where a sample is loaded. In the probe system for low-temperature high-precision heat transport measurement, the sample loader includes a first frame including a sample loading space, and a second frame including an open end coupled to the first frame to accommodate the sample loading space.


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