The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2025
Filed:
Jun. 22, 2018
Applicant:
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Inventors:
Luke Cirillo, Poing, DE;
Andreas Lagler, Rosenheim, DE;
Assignee:
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 7/00 (2006.01); G01R 1/02 (2006.01); G01R 13/02 (2006.01); G06F 3/04812 (2022.01); G06F 3/04842 (2022.01); G06F 3/04845 (2022.01); G06F 3/0485 (2022.01); G06F 3/04883 (2022.01); G06F 16/245 (2019.01);
U.S. Cl.
CPC ...
G01D 7/00 (2013.01); G01R 1/025 (2013.01); G01R 13/029 (2013.01); G06F 3/04812 (2013.01); G06F 3/04842 (2013.01); G06F 3/04845 (2013.01); G06F 3/0485 (2013.01); G06F 3/04883 (2013.01); G06F 16/245 (2019.01); G06F 2203/04806 (2013.01);
Abstract
A measurement device is provided. The measurement device comprises a display configured to display a measurement trace, an analyzing unit configured to analyze a subset of measurement data represented by the measurement trace on the basis of at least one target measurement parameter, and a post-processing unit configured to search for the at least one target measurement parameter.