The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2025
Filed:
Feb. 04, 2020
Topcon Corporation, Tokyo, JP;
Nobuyuki Nishita, Itabashi-ku, JP;
Topcon Corporation, Tokyo, JP;
Abstract
To efficiently and accurately detect coordinates positions of a measurement object formed in a linear shape regardless of a distance from a measurement light emitting unit. The provided survey system includes: a distance measuring unit; a deflecting unit for deflecting a direction of measurement light with respect to a reference optical axis and for scanning with the measurement light with respect to a prescribed center in a circumferential direction; and a calculation control unit which controls the distance measuring unit and the deflecting unit, wherein the calculation control unit detects coordinates of intersection points of a measurement object formed in a linear shape and a scan trajectory of the measurement light, and controls a deflection operation of the deflecting unit so that intervals of the intersection points adjacent to each other are constant intervals on the measurement object.