The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2025
Filed:
Sep. 15, 2024
China University of Geosciences (Wuhan), Wuhan, CN;
Yunfeng Ge, Wuhan, CN;
Zhongxu Wen, Wuhan, CN;
Yitong Hao, Wuhan, CN;
Zihao Li, Wuhan, CN;
Zilong Zhang, Wuhan, CN;
Changyang Liu, Wuhan, CN;
Bin Hu, Wuhan, CN;
Shiyu Yuan, Wuhan, CN;
Zishuo Zhao, Wuhan, CN;
CHINA UNIVERSITY OF GEOSCIENCES (WUHAN), Wuhan, CN;
Abstract
A method for determining a reasonable sampling interval with three-dimensional (3D) laser scanning includes: collecting rock joints; acquiring point cloud data of the rock joints with 3D laser scanning; performing preprocessing on acquired point cloud data; conducting indoor mechanical tests to determine rock mechanics parameters; calculating, with preprocessed point cloud data of the rock joints, joint roughness coefficients (JRCs) under different intervals obtained from statistical roughness parameters; fitting different relational curves according to a scatter plot between the different intervals and the JRCs to obtain a fitting equation; reversely calculating a JRC of the rock joint sample with the rock mechanics parameters to obtain a reversely calculated JRC; and substituting, according to a relational equation between the different intervals and the JRCs, the reversely calculated JRC into the fitting equation to determine a reasonable sampling interval for roughness evaluation.