The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Aug. 20, 2020
Applicant:

Cataler Corporation, Kakegawa, JP;

Inventor:

Chihiro Kasuya, Kakegawa, JP;

Assignee:

Cataler Corporation, Kakegawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01J 21/04 (2006.01); B01D 53/94 (2006.01); B01J 21/06 (2006.01); B01J 21/08 (2006.01); B01J 21/10 (2006.01); B01J 21/12 (2006.01); B01J 21/14 (2006.01); B01J 23/10 (2006.01); B01J 23/42 (2006.01); B01J 23/44 (2006.01); B01J 23/46 (2006.01); B01J 23/58 (2006.01); B01J 23/63 (2006.01); B01J 35/40 (2024.01); B01J 35/60 (2024.01); B01J 35/64 (2024.01); B01J 35/69 (2024.01); F01N 3/28 (2006.01);
U.S. Cl.
CPC ...
B01J 35/657 (2024.01); B01D 53/944 (2013.01); B01D 53/945 (2013.01); B01J 21/04 (2013.01); B01J 23/63 (2013.01); B01J 35/40 (2024.01); B01J 35/69 (2024.01); F01N 3/2828 (2013.01); B01D 2255/1023 (2013.01); B01D 2255/1025 (2013.01); B01D 2255/908 (2013.01); B01D 2255/9155 (2013.01); B01D 2255/9205 (2013.01); F01N 3/2842 (2013.01); F01N 2330/02 (2013.01); F01N 2370/02 (2013.01);
Abstract

The present invention provides an exhaust gas purification catalyst including a base material and a catalyst layer that is arranged on the base material. The catalyst layer includes a catalyst metal and a carrying material carrying the catalyst metal. The catalyst layer satisfies below: (1) in a pore distribution curve measured by a mercury porosimeter, a peak for the largest pore volume exists within a range of a pore diameter equal to or more than 1 μm and not more than 10 μm; and (2) on an electron microscopy observation image (with a 1000-fold magnification) of a surface of the catalyst layer, when areas of a plurality of voids comprised in the electron microscopy observation image are respectively calculated, a standard deviation for the areas of the plurality of voids is not more than 30 μm.


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