The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2025
Filed:
Jun. 02, 2022
Vatech Co., Ltd., Gyeonggi-do, KR;
Vatech Ewoo Holdings Co., Ltd., Gyeonggi-do, KR;
Han Sik Na, Gyeonggi-do, KR;
Da Hea Han, Gyeonggi-do, KR;
VATECH Co., Ltd., Gyeonggi-do, KR;
VATECH EWOO Holdings Co., Ltd., Gyeonggi-do, KR;
Abstract
An X-ray imaging apparatus is proposed. The X-ray imaging apparatus is configured to capture first and second X-ray images having examination object's alignment positions different from each other, the X-ray imaging apparatus including an imaging part configured to include a generator and a detector facing each other with an examination object interposed therebetween, and rotate the generator and the detector about a rotation axis therebetween to capture each of the first and second X-ray images, and an examination object alignment part configured to arrange the examination object between the generator and the detector, wherein a position of at least a part of the examination object alignment part is variable, so as to move and align the examination object to a first alignment position for capturing the first X-ray image and a second alignment position for capturing the second X-ray image, respectively.