The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Aug. 07, 2023
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Hamid Saber, San Diego, CA (US);

Jung Hyun Bae, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 72/04 (2023.01); H04W 8/24 (2009.01); H04W 72/23 (2023.01); H04W 72/51 (2023.01);
U.S. Cl.
CPC ...
H04W 72/23 (2023.01); H04W 8/24 (2013.01); H04W 72/51 (2023.01);
Abstract

Methods and apparatuses are provided in which a UE reports capability information indicating a first set of pairs and a second set of tuples. Each pair indicates serving cells configured for per-slot and per-span monitoring. Each tuple indicates serving cells configured for per-slot and per-span monitoring in an MCG and an SCG. A first pair of values for the MCG and a second pair of values for the SCG are received. A first value in each pair is a maximum number of serving cells configured for per-slot monitoring, and a second value in each pair is a maximum number of serving cells configured for per-span monitoring. A monitored candidate limit per slot is determined for the MCG and the SCG based on the first value. A monitored candidate limit per span is determined for the MCG and the SCG based on the second value.


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