The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Aug. 03, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Vinay Kumar Shrivastava, India, IN;

Avijit Manna, India, KR;

Kalyan Dhulipudi, India, KR;

Ankit Dhabriya, India, IN;

Ankit Srivastav, India, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 52/02 (2009.01); H04W 36/32 (2009.01); H04W 36/30 (2009.01);
U.S. Cl.
CPC ...
H04W 52/0232 (2013.01); H04W 52/0235 (2013.01); H04W 52/0245 (2013.01); H04W 52/0254 (2013.01); H04W 52/0274 (2013.01); H04W 36/304 (2023.05); H04W 36/324 (2023.05);
Abstract

The present subject matter describes performing radio resource management (RRM) measurements by a WTRU in a 3GPP networks. The method comprise defining at-least one of: a) a channel condition threshold, b) a WTRU mobility threshold, and c) a measurement-reliability threshold. A first sub-set of reference-signal samples are measured out of a set of reference-signal samples based on sensing at least one of current channel conditions and mobility-conditions. A reliability-parameter associated with the first sub-set of measured samples is checked. Finally, network-measurement operation is concluded in case of the reliability-parameter being in accordance with the pre-defined reliability-thresholds.


Find Patent Forward Citations

Loading…