The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Mar. 03, 2021
Applicant:

Sharp Kabushiki Kaisha, Sakai, JP;

Inventors:

Chia-Hao Yu, Taipei, TW;

Wan-Chen Lin, Taipei, TW;

Chien-Chun Cheng, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/06 (2006.01); H04L 5/00 (2006.01);
U.S. Cl.
CPC ...
H04B 7/0695 (2013.01); H04L 5/0035 (2013.01);
Abstract

A method and apparatus for determining a BFD RS are provided. The method includes receiving at least one MAC CE for TCI state activation, each MAC CE indicating a CORESET and at least one TCI state, at least a subset of the indicated TCI state(s) belonging to a first group of TCI states associated with a first TRP; and performing first operations after determining that a total number of TCI states included in the first group of TCI states is larger than a first threshold number, the first operations including: selecting at least one first TCI state from the first group of TCI states; and determining at least one first BFD RS for detecting a first beam failure condition of the first TRP based on the at least one first TCI state.


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