The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Nov. 12, 2019
Applicant:

Laboratory Corporation of America Holdings, Burlington, NC (US);

Inventors:

Alexander L. Katayev, Graham, NC (US);

Arren H. Fisher, Durham, NC (US);

Dajie Luo, Cary, NC (US);

Mark Sharp, Gibsonville, NC (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 50/70 (2018.01); G16H 10/40 (2018.01); G16H 70/00 (2018.01);
U.S. Cl.
CPC ...
G16H 50/70 (2018.01); G16H 70/00 (2018.01); G16H 10/40 (2018.01);
Abstract

The invention relates to methods for indirectly determining clinical laboratory reference intervals. In one aspect, a reference interval is determined using all measurements for a given analyte stored in a large existing database. In other aspects, a characteristic of a subject is used to select a reference population for inclusion in reference interval calculations. In other aspects, the invention provides methods for changing treatment plan, diagnosis, or prognosis for an individual subject based on differences between the new reference interval and a previously utilized reference interval. In other aspects, the invention provides systems and computer readable media for indirectly determining reference intervals.


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