The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2025
Filed:
Apr. 28, 2022
Toyota Research Institute, Inc., Los Altos, CA (US);
Jonathan A. Daudelin, Ann Arbor, MI (US);
Jacopo Serafin, Dexter, MI (US);
Sachithra Hemachandra, Sunnyvale, CA (US);
Toyota Research Institute, Inc., Los Altos, CA (US);
Toyota Jidosha Kabushiki Kaisha, Toyota, JP;
Abstract
Systems, methods, and other embodiments described herein relate to detecting reflection artifacts in a point cloud. In one embodiment, a method includes generating a first convex hull for defining an outline of a first cluster of points in a depth image and generating a second convex hull for defining an outline of a second cluster of points in the depth image. The first cluster of points originates from a point cloud and the second cluster of points originates from the point cloud. The method includes determining whether the second cluster of points is a reflection artifact based on identifying if a portion of the second convex hull is enclosed in the first convex hull and a range of the second convex hull is larger than a range of the first convex hull.