The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Oct. 12, 2021
Applicant:

Zebra Technologies Corporation, Lincolnshire, IL (US);

Inventor:

Sanjeewa Thimirachandra, Kotugoda, LK;

Assignee:

Zebra Technologies Corporation, Lincolnshire, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/11 (2017.01); G06T 7/73 (2017.01); G06T 7/80 (2017.01); G06T 7/62 (2017.01);
U.S. Cl.
CPC ...
G06T 7/85 (2017.01); G06T 7/11 (2017.01); G06T 7/73 (2017.01); G06T 7/62 (2017.01); G06T 2207/10012 (2013.01); G06T 2207/10028 (2013.01);
Abstract

An example computing device includes: a three-dimensional (3D) sensor configured to capture point cloud data from a field of view; an auxiliary sensor configured to capture a reference depth measurement corresponding to a surface within the field of view; a processor interconnected with the 3D sensor and the auxiliary sensor, the processor configured to: control the 3D sensor and the auxiliary sensor to capture the point cloud data and the reference depth measurement; select a region of the point could data including a position of the reference depth measurement; determine a representative depth value of the region of the point cloud data to compare to the reference depth measurement; determine whether the representative depth value is within a similarity threshold to the reference depth measurement; and determine, based on whether the representative depth value is within the similarity threshold to the reference depth measurement, whether to use the point cloud data for a dimensioning operation.


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