The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Jul. 19, 2021
Applicant:

Faro Technologies, Inc., Lake Mary, FL (US);

Inventor:

Jafar Parian, Schlieren, CH;

Assignee:

FARO Technologies, Inc., Lake Mary, FL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/33 (2017.01); G01S 17/89 (2020.01); G06T 3/00 (2024.01); G06T 3/14 (2024.01);
U.S. Cl.
CPC ...
G06T 7/344 (2017.01); G01S 17/89 (2013.01); G06T 3/14 (2024.01); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01);
Abstract

According to one or more embodiments, a method includes capturing a first three-dimensional (3D) point cloud and a second 3D point cloud. Each of the 3D point clouds includes a plurality 3D coordinates corresponding to one or more objects scanned in a surrounding environment. The first 3D point cloud and the second 3D point cloud capturing at least one overlapping portion. Further, the method includes capturing a first ultrawide-angle image and a second ultrawide-angle image of the surrounding environment, the first ultrawide-angle image captures color information of the first 3D point cloud, and the second ultrawide-angle image captures color information of the second 3D point cloud. The method further includes registering the first 3D point cloud and the second 3D point cloud by mapping one or more features from the first ultrawide-angle image and the second ultrawide-angle image.


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