The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2025
Filed:
Jan. 19, 2022
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/11 (2017.01); B60K 35/28 (2024.01); B60K 37/00 (2024.01); B60W 10/04 (2006.01); B60W 10/20 (2006.01); G06V 10/764 (2022.01); G06V 10/771 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01); G06V 20/58 (2022.01);
U.S. Cl.
CPC ...
G06T 7/11 (2017.01); B60K 37/00 (2013.01); B60W 10/04 (2013.01); B60W 10/20 (2013.01); G06V 10/764 (2022.01); G06V 10/771 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01); G06V 20/58 (2022.01); B60K 35/28 (2024.01); B60K 2360/177 (2024.01); B60W 2420/403 (2013.01); B60W 2510/0652 (2013.01); B60W 2510/20 (2013.01);
Abstract
An electronic device extracts feature data from an input image, calculates one or more class maps from the feature data using a classifier layer, calculates one or more cluster maps from the feature data using a clustering layer, and generates image segmentation data using the one or more class maps and the one or more cluster maps.