The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

May. 29, 2019
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:
Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 21/31 (2006.01); G01N 21/64 (2006.01); G16H 10/40 (2018.01); G16H 30/00 (2018.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G01N 21/31 (2013.01); G01N 21/6486 (2013.01); G16H 10/40 (2018.01); G16H 30/00 (2018.01); G01N 2021/1765 (2013.01); G06T 2207/10064 (2013.01); G06T 2207/20076 (2013.01);
Abstract

The ability to obtain and digitise pathology samples (such as in histopathology or cytopathology) has opened up the possibility of accurate and automated computer operated analysis, or computer-assisted analysis, when diagnosing a wide range of medical conditions. A typical digital pathology image analysis pipeline involves a large number of image pre-processing and processing operations. Small changes in the parameters used in these algorithms might lead to significant changes in the eventual pathological finding. Accordingly, the present application proposes to perform a sensitivity analysis on a digital pathology image analysis pipeline to assess the sensitivity of a given pathology result to changes of parameters in the digital pathology image analysis pipeline.


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